Antisite-related defects in plastically deformed GaAs

P. Omling, E. R. Weber, and L. Samuelson
Phys. Rev. B 33, 5880 – Published 15 April 1986
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Abstract

Optical absorption measurements on plastically deformed GaAs show that the total extrinsic absorption increases with deformation, while the quenchable EL2 absorption stays constant. The nonquenchable extrinsic absorption is observed to be proportional to the EPR measured AsGa containing defects produced during deformation. Since the AsGa-related defects produced by plastic deformation anneal at T∼650 °C, the implication for any correlation between EL2 and AsGa antisites is that only those AsGa-related EPR centers which are stable up to at least 950 °C can possibly be responsible for the EL2 level.

  • Received 12 August 1985

DOI:https://doi.org/10.1103/PhysRevB.33.5880

©1986 American Physical Society

Authors & Affiliations

P. Omling

  • Center for Advanced Materials, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720

E. R. Weber

  • Center for Advanced Materials, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720 and Department of Materials Science, University of California, Berkeley, CA 94720.

L. Samuelson

  • Department of Solid State Physics, University of Lund, Box 118, S-22100 Lun d, Sweden.

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Vol. 33, Iss. 8 — 15 April 1986

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