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Photoelectron diffraction study of Si(001) 2 × 1-K surface: Existence of a potassium double layer

T. Abukawa and S. Kono
Phys. Rev. B 37, 9097(R) – Published 15 May 1988
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Abstract

X-ray photoelectron diffraction patterns of K 2p core levels have been measured for the Si(001) 2 × 1-K surface. From a kinematical analysis of the diffraction patterns, it is concluded that a sawtooth-type arrangement of the potassium double array is present over the substrate. This is in disagreement with an existing assumption of the one dimensionality of the alkalimetal-Si(001) systems.

  • Received 28 January 1988

DOI:https://doi.org/10.1103/PhysRevB.37.9097

©1988 American Physical Society

Authors & Affiliations

T. Abukawa and S. Kono

  • Department of Physics, Faculty of Science, Tohoku University, Sendai 980, Japan

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Vol. 37, Iss. 15 — 15 May 1988

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