I-V characteristics of coupled ultrasmall-capacitance normal tunnel junctions

K. Mullen, E. Ben-Jacob, R. C. Jaklevic, and Z. Schuss
Phys. Rev. B 37, 98 – Published 1 January 1988
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Abstract

We present a theoretical study of two ultrasmall-capacitance normal tunnel junctions connected in series and driven by a dc voltage source, using the semiclassical junction approach. We show that the two junctions in series display a voltage offset similar to that of a single junction that is driven by a current source. We also show that two junctions in series can, for the right set of parameters, produce an I-V curve with distinct steps. A parallel array of such series units shows similar behavior. We suggest specific experimental realizations of two junctions in series and the parallel array using a scanning tunneling microscope and a granular array of small metal drops. We also compare our predictions with experiments in the literature.

  • Received 10 April 1987

DOI:https://doi.org/10.1103/PhysRevB.37.98

©1988 American Physical Society

Authors & Affiliations

K. Mullen and E. Ben-Jacob

  • Department of Physics, The University of Michigan, Ann Arbor, Michigan 48109 and Raymond and Beverly Sackler Faculty of Exact Sciences, School of Physics and Astronomy, Tel-Aviv University, 69978 Tel-Aviv, Israel

R. C. Jaklevic

  • Scientific Laboratory, Ford Motor Company, Dearborn, Michigan 48121

Z. Schuss

  • School of Mathematics, Tel-Aviv University, 69978 Tel-Aviv, Israel

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Issue

Vol. 37, Iss. 1 — 1 January 1988

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