Statistical Mechanics of Charged Traps in an Amorphous Semiconductor

G. Srinivasan
Phys. Rev. B 4, 2581 – Published 15 October 1971
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Abstract

The effect of a Coulomb interaction between charged traps in an amorphous semiconductor is investigated within the premises of the Mott-Cohen-Fritzsche-Ovshinsky model. The grand partition function is expressed as a functional integral over a set of Gaussian random fields. The free energy is expressed as a sum of the mean-field result plus fluctuations about the mean field. It is shown that for the system under consideration, the mean field is just the Hartree self-consistent field and that at T=0 °K it represents the exact ground state. It is shown that the fluctuations about the mean field represent correlations in the system. Approximate expressions for the mean occupation number and the renormalized energies of the charges are obtained as well as the renormalized single-particle density of states. The excitation spectrum of single quasiparticles, within any given band, is shown to have a quasigap. It is shown that the effect of a Coulomb interaction between the charged traps is to reduce the density of states at the Fermi energy by a factor of 2 below its value in the absence of interactions.

  • Received 12 February 1971

DOI:https://doi.org/10.1103/PhysRevB.4.2581

©1971 American Physical Society

Authors & Affiliations

G. Srinivasan

  • Department of Physics and the James Franck Institute, The University of Chicago, Chicago, Illinois 60637

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Issue

Vol. 4, Iss. 8 — 15 October 1971

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