Phonon coupling to excitations of free and localized electrons in n-type ZnSe

D. J. Olego, T. Marshall, J. Gaines, and K. Shahzad
Phys. Rev. B 42, 9067 – Published 15 November 1990
PDFExport Citation

Abstract

The coupling mechanisms between longitudinal-optical phonons and electronic excitations in n-type ZnSe layers were investigated with Raman spectroscopy in conjunction with transport measurements. The layers were grown by molecular-beam epitaxy and were intentionally doped below the Mott criterion for the insulator-metal transition. The nature of the electron-phonon interaction is determined by the degree of electron localization, which was effectively changed by temperature and donor concentration. The longitudinal-optical phonons couple to plasmons when electrons are thermally excited into the conduction band and to a continuum of electronic excitations when electrons are localized in an impurity band or at donor sites. In both cases unbound phonons are observed. From the renormalized phonon frequencies at high temperature, values of free-electron concentration as a function of temperature were established. They are in excellent agreement with Hall-effect determinations. At low temperatures the phonon Raman profiles are asymmetric and show Fano-type line shapes. The electronic continuum responsible for the phonon self-energies at low temperature was identified as Raman scattering by bound electrons.

  • Received 25 June 1990

DOI:https://doi.org/10.1103/PhysRevB.42.9067

©1990 American Physical Society

Authors & Affiliations

D. J. Olego, T. Marshall, J. Gaines, and K. Shahzad

  • Philips Laboratories, North American Philips Corporation, Briarcliff Manor, New York 10510

References (Subscription Required)

Click to Expand
Issue

Vol. 42, Iss. 14 — 15 November 1990

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×