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H passivation of Si impurities in GaAs

L. Pavesi and P. Giannozzi
Phys. Rev. B 43, 2446(R) – Published 15 January 1991
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Abstract

The equilibrium sites, vibrational frequencies, and electronic properties of interstitial H in GaAs doped with Si have been studied by first-principles calculations in the local-density approximation within a supercell approach. Two differenct Si sites in GaAs have been examined: Si replacing a Ga atom (SeGa donor) and Si replacing an As atom (SiAs acceptor). We find that the stable configuration for the H-SiGa complex is the antibonding-Si site. The lattice undergoes a large relaxation and the Si-As bond is almost broken. The stable site for the H-SiAs complex is along the SiAs-Ga bond. H binds to the Si and Ga atoms forming a three-center bond. In both cases the lattice relaxation is essential in order to obtain the the passivation of the impurities. The computed localized vibrational frequencies and dissocation energies of the H-Si complexes agree reasonably well with experimental results.

  • Received 18 September 1990

DOI:https://doi.org/10.1103/PhysRevB.43.2446

©1991 American Physical Society

Authors & Affiliations

L. Pavesi

  • Institut de Micro- et Optoélectronique (IMO), Ecole Polytechnique Féderale de Lausanne, PHB-Ecublens, CH-1015 Lausanne, Switzerland

P. Giannozzi

  • Institut Romand de Recherche Numérique en Physique des Matériaux (IRRMA), PHB-Ecublens, CH-1015 Lausanne, Switzerland

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Vol. 43, Iss. 3 — 15 January 1991

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