Fine structure of the Ca 2p x-ray-absorption edge for bulk compounds, surfaces, and interfaces

F. J. Himpsel, U. O. Karlsson, A. B. McLean, L. J. Terminello, F. M. F. de Groot, M. Abbate, J. C. Fuggle, J. A. Yarmoff, B. T. Thole, and G. A. Sawatzky
Phys. Rev. B 43, 6899 – Published 15 March 1991
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Abstract

The fine structure of the Ca 2p soft-x-ray-absorption edge is studied for a variety of bulk compounds (Ca metal, CaSi2, CaO, and CaF2), for surfaces and interfaces [CaF2(111), BaF2 on CaF2(111), Ca and CaF2 on Si(111)], and for defects (F centers in CaF2). The observed multiplet structure is explained by atomic calculations in a crystal field [cubic Oh for the bulk and threefold C3v for the (111) surfaces and interfaces]. While the bulk spectra are isotropic, the surface and interface spectra exhibit a pronounced polarization dependence, which is borne out by the calculations. This effect can be used to become surface and/or interface selective via polarization-modulation experiments, even for buried interfaces. A change in valence from Ca2+ to Ca1+ causes a downwards energy shift and extra multiplet lines according to the calculation. The energy shift is observed for F centers at the CaF2 surface and for the CaF2/Si(111) interface.

  • Received 15 October 1990

DOI:https://doi.org/10.1103/PhysRevB.43.6899

©1991 American Physical Society

Authors & Affiliations

F. J. Himpsel, U. O. Karlsson, A. B. McLean, and L. J. Terminello

  • IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598

F. M. F. de Groot, M. Abbate, and J. C. Fuggle

  • Research Institute for Materials, University of Nijmegen, Toernooiveld, 6525 ED Nijmegen, The Netherlands

J. A. Yarmoff

  • Department of Physics, University of California, Riverside, California 92521

B. T. Thole and G. A. Sawatzky

  • Materials Science Centre, University of Groningen, Nijenborgh 18, Paddepoel, 9747 AG Groningen, The Netherlands

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Issue

Vol. 43, Iss. 9 — 15 March 1991

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