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Chemical-state-resolved x-ray standing-wave analysis using chemical shift in photoelectron spectra

Munehiro Sugiyama, Satoshi Maeyama, Stefan Heun, and Masaharu Oshima
Phys. Rev. B 51, 14778(R) – Published 15 May 1995
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Abstract

A chemical-state-resolved x-ray standing-wave analysis using the chemical shift in photoelectron spectra was performed for a GaAs(001) surface treated with a (NH4)2Sx solution. The sulfur atoms in the S-Ga chemical state on the surface are at the bridge site but are not highly ordered. The degree of ordering of the sulfur atoms in the S-Ga chemical state is improved, and randomly distributed sulfur atoms in the S-As and S-S chemical states disappear as a result of post annealing.

  • Received 21 December 1994

DOI:https://doi.org/10.1103/PhysRevB.51.14778

©1995 American Physical Society

Authors & Affiliations

Munehiro Sugiyama, Satoshi Maeyama, Stefan Heun, and Masaharu Oshima

  • NTT Interdisciplinary Research Laboratories, 3-9-11 Midori-cho, Musashino-shi, Tokyo 180, Japan

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Issue

Vol. 51, Iss. 20 — 15 May 1995

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