Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence

F. Yubero, J. M. Sanz, B. Ramskov, and S. Tougaard
Phys. Rev. B 53, 9719 – Published 15 April 1996
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Abstract

A model to reproduce inelastic electron scattering cross sections as determined from reflection-electron-energy-loss experiments is proposed. This model is an extension of model B from Yubero and Tougaard [Phys. Rev. B 46, 2486 (1992)]. Here, a more general geometry is considered where the incidence and exit angles can be varied. Then, for a given geometry and energy of the primary electrons, the dielectric function of the sample is the only input for the calculations. A systematic study of the behavior of the model is presented for the case of Si and Fe. © 1996 The American Physical Society.

  • Received 14 August 1995

DOI:https://doi.org/10.1103/PhysRevB.53.9719

©1996 American Physical Society

Authors & Affiliations

F. Yubero

  • Laboratoire pour l'Utilisation du Rayonnement Electromagnétique, Bâtiment 209d, Centre Universitaire Paris-Sud, F-91405 Orsay, France

J. M. Sanz

  • Instituto Universitario Nicolás Cabrera and Departamento de Física Aplicada C-XII, Universidad Autónoma de Madrid, Cantoblanco, E-28049 Madrid, Spain

B. Ramskov and S. Tougaard

  • Department of Physics, University of Odense, DK-5230 Odense M, Denmark

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Vol. 53, Iss. 15 — 15 April 1996

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