Frequency-dependent hopping conductivity between silicon nanocrystallites: Application to porous silicon

E. Lampin, C. Delerue, M. Lannoo, and G. Allan
Phys. Rev. B 58, 12044 – Published 1 November 1998
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Abstract

We show how it is possible to perform a full calculation of the frequency-dependent hopping conductivity of a disordered array of semiconductor crystallites once their statistical distribution is known. We first apply this to a weakly disordered distribution of silicon spheres connected by silicon bridges and show the importance of the topology in determining the activation energy characteristic of the temperature dependence. We then use a model distribution to simulate the case of porous silicon and from this get a coherent description of various related properties. Finally, we emphasize the applicability of the method to determine the hopping conductivity of artificially built semiconductor nanostructures.

  • Received 27 July 1998

DOI:https://doi.org/10.1103/PhysRevB.58.12044

©1998 American Physical Society

Authors & Affiliations

E. Lampin, C. Delerue, M. Lannoo, and G. Allan

  • IEMN-Departement ISEN (CNRS), UMR9929, 41 Boulevard Vauban, 59046 Lille Cedex, France

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Vol. 58, Iss. 18 — 1 November 1998

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