Structural properties of amorphous silicon nitride

F. de Brito Mota, J. F. Justo, and A. Fazzio
Phys. Rev. B 58, 8323 – Published 1 October 1998
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Abstract

We developed an empirical potential for interactions between Si and N to describe silicon nitride systems using the Tersoff functional form. The fitting parameters were found using a set of ab initio and experimental results of the crystalline phase. Using this empirical model, we explored the structural properties of amorphous silicon nitride through Monte Carlo simulations, and compared them to available experimental data. The good description of the aSiNx system for a wide range of nitrogen contents (0<x<1.5) shows the reliability of this model.

  • Received 25 February 1998

DOI:https://doi.org/10.1103/PhysRevB.58.8323

©1998 American Physical Society

Authors & Affiliations

F. de Brito Mota

  • Instituto de Física da Universidade de São Paulo, CP 66318, CEP 05315-970, São Paulo - SP, Brazil
  • Instituto de Física da UFBa, Campus Universitario de Ondina, CEP 40210-340 Salvador - BA, Brazil

J. F. Justo and A. Fazzio

  • Instituto de Física da Universidade de São Paulo, CP 66318, CEP 05315-970, São Paulo - SP, Brazil

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Vol. 58, Iss. 13 — 1 October 1998

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