Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy

Álvaro San Paulo and Ricardo García
Phys. Rev. B 64, 193411 – Published 25 October 2001
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Abstract

Amplitude-modulation (tapping mode) atomic force microscopy is a technique for high resolution imaging of a wide variety of surfaces in air and liquid environments. Here by using the virial theorem and energy conservation principles we have derived analytical relationships between the oscillation amplitude, phase shift, and average tip-surface forces. We find that the average value of the interaction force and oscillation and the average power dissipated by the tip-surface interaction are the quantities that control the amplitude reduction. The agreement obtained between analytical and numerical results supports the analytical method.

  • Received 13 November 2000

DOI:https://doi.org/10.1103/PhysRevB.64.193411

©2001 American Physical Society

Authors & Affiliations

Álvaro San Paulo and Ricardo García*

  • Instituto de Microelectrónica de Madrid, CSIC, Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain

  • *Corresponding author. Email address: rgarcia@imm.cnm.csic.es

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Issue

Vol. 64, Iss. 19 — 15 November 2001

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