Picosecond soft x-ray absorption measurement of the photoinduced insulator-to-metal transition in VO2

A. Cavalleri, H. H. W. Chong, S. Fourmaux, T. E. Glover, P. A. Heimann, J. C. Kieffer, B. S. Mun, H. A. Padmore, and R. W. Schoenlein
Phys. Rev. B 69, 153106 – Published 28 April 2004
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Abstract

We directly measure the photoinduced insulator-to-metal transition in VO2 using time-resolved near-edge x-ray absorption. Picosecond pulses of synchrotron radiation are used to detect the redshift in the vanadium L3 edge at 516 eV, which is associated with the transient collapse of the low-temperature band gap. We identify a two-component temporal response, corresponding to an ultrafast transformation over a 50 nm surface layer, followed by 40 m/s thermal growth of the metallic phase into the bulk.

  • Received 19 September 2003

DOI:https://doi.org/10.1103/PhysRevB.69.153106

©2004 American Physical Society

Authors & Affiliations

A. Cavalleri1,*, H. H. W. Chong1,4, S. Fourmaux3, T. E. Glover2, P. A. Heimann2, J. C. Kieffer3, B. S. Mun2, H. A. Padmore2, and R. W. Schoenlein1

  • 1Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA
  • 2Advanced Light Source Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720, USA
  • 3Université du Québec, INRS énergie et matériaux, Varennes, Québec, Canada
  • 4Applied Science and Technology Graduate Group, University of California, Berkeley, California 94720, USA

  • *Corresponding author. Email address: acavalleri@lbl.gov

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Vol. 69, Iss. 15 — 15 April 2004

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