Fabrication and characterization of a negative-refractive-index composite metamaterial

A. F. Starr, P. M. Rye, D. R. Smith, and S. Nemat-Nasser
Phys. Rev. B 70, 113102 – Published 17 September 2004

Abstract

We have designed, produced, and experimentally characterized 2.7mm thick composite panels having negative refractive index between 8.4 and 9.2GHz. The composite metamaterial is fabricated using conventional commercial multilayer circuit-board lithography; three-dimensional physical (as opposed to electromagnetic) structure is introduced by the use of vias to form sections of the scattering elements in the direction perpendicular to the circuit board surfaces. From scattering parameter measurements, we show that the complex permittivity, permeability, index, and impedance of the composite can be unambiguously determined. The measurements enable the quantitative determination of the negative index band and associated losses. The extracted material parameters are shown to be in excellent agreement with simulation results.

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  • Received 21 March 2004

DOI:https://doi.org/10.1103/PhysRevB.70.113102

©2004 American Physical Society

Authors & Affiliations

A. F. Starr*, P. M. Rye, D. R. Smith, and S. Nemat-Nasser

  • Department of Mechanical and Aerospace Engineering, University of California, San Diego, La Jolla, California 92093, USA

  • *Also at SensorMetrix, 5965 Pacific Center Blvd., Ste. 701, SanDiego, CA 92121-4323.
  • Also at Department of Physics, University of California, San Diego, La Jolla, CA 92093.

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Issue

Vol. 70, Iss. 11 — 15 September 2004

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