Emission intermittency in silicon nanocrystals

Frank Cichos, Jörg Martin, and Christian von Borczyskowski
Phys. Rev. B 70, 115314 – Published 21 September 2004

Abstract

We present detailed results of blinking studies on individual silicon nanocrystals. The experiments show, that similar to II-VI semiconductor nanocrystals, the blinking process obeys a power law statistics. An excitation intensity dependence of the power law exponent is found for the off time probability distribution. The intensity dependence is interpreted in terms of an intensity dependent tunneling rate due to Auger assisted processes. Further we demonstrate a relation of the off time distribution to the bleaching and recovery of the emission of nanocrystal ensembles, which gives further insight in the blinking behavior according to ensemble studies. The experimental data is discussed in terms of two alternative blinking models. Evidence is provided for the existence of self-trapped polaron-like states for the ejected charge.

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  • Received 11 March 2004

DOI:https://doi.org/10.1103/PhysRevB.70.115314

©2004 American Physical Society

Authors & Affiliations

Frank Cichos*

  • Photonics and Optical Materials, Institute of Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany

Jörg Martin and Christian von Borczyskowski

  • Optical Spectroscopy and Molecular Physics, Institute of Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany

  • *Electronic address: cichos@physik.tu-chemnitz.de
  • Electronic address: j.martin@physik.tu-chemnitz.de
  • Electronic address: borczyskowski@physik.tu-chemnitz.de

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Issue

Vol. 70, Iss. 11 — 15 September 2004

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