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Ferroelectricity in ultrathin perovskite films

Na Sai, Alexie M. Kolpak, and Andrew M. Rappe
Phys. Rev. B 72, 020101(R) – Published 7 July 2005; Erratum Phys. Rev. B 74, 059901 (2006)

Abstract

We report studies of ferroelectricity in ultrathin perovskite films with realistic electrodes. The results reveal stable ferroelectric states in thin films less than 10Å thick with polarization normal to the surface. Under short-circuit boundary conditions, the screening effect of realistic electrodes and the influence of real metal-oxide interfaces on thin film polarization are investigated. Our studies indicate that metallic screening from the electrodes is affected by the difference in work functions at oxide surfaces. We demonstrate this effect in ferroelectric PbTiO3 and BaTiO3 films.

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  • Received 28 February 2005

DOI:https://doi.org/10.1103/PhysRevB.72.020101

©2005 American Physical Society

Erratum

Erratum: Ferroelectricity in ultrathin perovskite films [Phys. Rev. B 72, 020101(R) (2005)]

Na Sai, Alexie M. Kolpak, and Andrew M. Rappe
Phys. Rev. B 74, 059901 (2006)

Authors & Affiliations

Na Sai, Alexie M. Kolpak, and Andrew M. Rappe

  • The Makineni Theoretical Laboratories, Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania 19104-6323, USA

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Issue

Vol. 72, Iss. 2 — 1 July 2005

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