Valence state of $\mathrm{Tm}$ in $\mathrm{Tm}X$ $(X=\mathrm{S},\mathrm{Se},\mathrm{Te})$ investigated by resonant inelastic x-ray scattering

Valence state of $Tm$ in $Tm X$ $(X = S, Se, Te)$ investigated by resonant inelastic x-ray scattering

I. Jarrige, H. Ishii, Y. Q. Cai, J.-P. Rueff, C. Bonnelle, T. Matsumura, and S. R. Shieh

Phys. Rev. B 72, 075122 – Published 16 August 2005

Abstract

The electronic structure of thulium monochalcogenides $Tm X$ $(X = S, Se, Te)$ is investigated by x-ray absorption spectroscopy (XAS) in the partial fluorescence yield mode (PFY-XAS) and resonant x-ray emission spectroscopy around and far below the edge. These three resonant inelastic x-ray scattering (RIXS)-derived techniques yield consistent values of the thulium valency of 2.67, 2.65, and 2.70, respectively, in the mixed-valent compound TmSe. These values are in closer agreement with the valency derived from the lattice parameter measurement compared to previous x-ray photoemission spectroscopy and XAS studies. The study demonstrates that RIXS is a powerful and accurate probe of mixed-valent states in $f$ -electron systems.

Received 4 February 2005

DOI:https://doi.org/10.1103/PhysRevB.72.075122

Authors & Affiliations

I. Jarrige, H. Ishii, and Y. Q. Cai

National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan

J.-P. Rueff and C. Bonnelle

Laboratoire de Chimie Physique–Matière et Rayonnement (UMR 7614), Université Paris 6, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France

T. Matsumura

Department of Physics, Tohoku University, Sendai 980-8578, Japan

S. R. Shieh

Department of Earth Sciences, National Cheng Kung University, Tainan 701, Taiwan

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Vol. 72, Iss. 7 — 15 August 2005

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Physical Review B

covering condensed matter and materials physics

Valence state of $Tm$ in $Tm X$ $(X = S, Se, Te)$ investigated by resonant inelastic x-ray scattering

I. Jarrige, H. Ishii, Y. Q. Cai, J.-P. Rueff, C. Bonnelle, T. Matsumura, and S. R. Shieh

Phys. Rev. B 72, 075122 – Published 16 August 2005

Abstract

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Physical Review B

covering condensed matter and materials physics

Valence state of Tm in TmX (X=S,Se,Te) investigated by resonant inelastic x-ray scattering

I. Jarrige, H. Ishii, Y. Q. Cai, J.-P. Rueff, C. Bonnelle, T. Matsumura, and S. R. Shieh

Phys. Rev. B 72, 075122 – Published 16 August 2005

Abstract

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Valence state of $Tm$ in $Tm X$ $(X = S, Se, Te)$ investigated by resonant inelastic x-ray scattering