Ferromagnetism induced by planar nanoscale CuO inclusions in Cu-doped ZnO thin films

C. Sudakar, J. S. Thakur, G. Lawes, R. Naik, and V. M. Naik
Phys. Rev. B 75, 054423 – Published 28 February 2007

Abstract

We report ferromagnetism above 300K in ZnO:xCu (x in at. %) sputtered thin films. For x<1, a large magnetic moment of 1.6μBCu was observed, which decreases monotonically with increasing x. We find evidence that the ferromagnetic moment is due to Cu-O planar nanophase inclusions in ZnO basal planes. The presence of CuO nanophase is confirmed by transmission electron microscopy, x-ray diffraction, and Raman spectroscopy studies. These inclusions are present even for x<3, where Cu-O structures of a few nanometers in size are observed. Field-cooled and zero-field-cooled magnetization measurements show a bifurcation for temperatures below 300K.

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  • Received 13 September 2006

DOI:https://doi.org/10.1103/PhysRevB.75.054423

©2007 American Physical Society

Authors & Affiliations

C. Sudakar1,*, J. S. Thakur2, G. Lawes1, R. Naik1, and V. M. Naik3

  • 1Department of Physics and Astronomy, Wayne State University, Detroit, Michigan 48201, USA
  • 2Department of Electrical and Computer Engineering, Wayne State University, Detroit, Michigan 48202, USA
  • 3Department of Natural Sciences, University of Michigan-Dearborn, Dearborn, Michigan 48128, USA

  • *Author to whom correspondence should be addressed. Electronic address: csudakar@gmail.com

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Vol. 75, Iss. 5 — 1 February 2007

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