Magnetoresistance and efficiency measurements of Alq3-based OLEDs

Pratik Desai, P. Shakya, T. Kreouzis, W. P. Gillin, N. A. Morley, and M. R. J. Gibbs
Phys. Rev. B 75, 094423 – Published 23 March 2007

Abstract

Magnetoresistance and efficiency measurements of indium tin oxide/N,N-diphenyl-N,N bis(3-methylphenyl)-(1,1-biphenyl)-4,4 diamine/aluminum tris(8-hydroxyquinoline)/cathode organic light-emitting diode structures have been made as a function of magnetic field and cathode type. It has been found that magnetoresistance occurs only when there is light emission from the devices, which suggests that the magnetoresistance is related to exciton formation. Comparison of the effects of applied field on device efficiency and magnetoresistance shows that the magnetoresistance cannot be due to the recombination current. We suggest that the effect may be due to trapping of charge carriers at triplet excitons within the device.

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  • Received 13 October 2006

DOI:https://doi.org/10.1103/PhysRevB.75.094423

©2007 American Physical Society

Authors & Affiliations

Pratik Desai, P. Shakya, T. Kreouzis, and W. P. Gillin

  • Department of Physics, Queen Mary, University of London, Mile End Road, London, E1 4NS, United Kingdom

N. A. Morley and M. R. J. Gibbs

  • Department of Engineering Materials, University of Sheffield, Sheffield, S1 3JD, United Kingdom

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Issue

Vol. 75, Iss. 9 — 1 March 2007

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