Far-field imaging by a planar lens: Diffraction versus superresolution

Nicholas A. Kuhta, Viktor A. Podolskiy, and Alexei L. Efros
Phys. Rev. B 76, 205102 – Published 6 November 2007

Abstract

We resolve the long-standing controversy regarding far-field imaging by a planar lens made of a left-handed medium and demonstrate theoretically that the far-field image has a fundamentally different origin depending on the relationship between losses inside the lens and the wavelength of the light, λ. At small enough λ, the image is always governed by diffraction theory, and the resolution is independent of the absorption if both Imϵ1 and Imμ1. For any finite λ, however, a critical absorption exists below which the superresolution regime occurs, although this absorption is extremely low and can hardly be achieved. We demonstrate that the transition between the diffraction-limited and superresolution regimes is governed by a universal parameter combining absorption, wavelength, and lens thickness. Finally, we show that this parameter is related to the resonant excitation of surface plasma waves.

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  • Received 22 May 2007

DOI:https://doi.org/10.1103/PhysRevB.76.205102

©2007 American Physical Society

Authors & Affiliations

Nicholas A. Kuhta and Viktor A. Podolskiy*

  • Department of Physics, Oregon State University, 301 Weniger Hall, Corvallis, Oregon 97331, USA

Alexei L. Efros

  • Department of Physics, University of Utah, Salt Lake City, Utah 84112, USA

  • *viktor.podolskiy@physics.oregonstate.edu
  • efros@physics.utah.edu

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Issue

Vol. 76, Iss. 20 — 15 November 2007

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