Abstract
Structure-spectra relationship in semiconductor quantum dots (QDs) is investigated by subjecting the same QD sample to single-dot spectroscopy and cross-sectional scanning tunneling microscopy (XSTM) structural measurements. We find that the conventional approach of using XSTM structure as input to calculate the spectra produces some notable conflicts with the measured spectra. We demonstrate a theoretical “inverse approach” which deciphers structural information from the measured spectra and finds structural models that agree with both XSTM and spectroscopy data. This effectively “closes the loop” between structure and spectroscopy in QDs.
- Received 4 September 2009
DOI:https://doi.org/10.1103/PhysRevB.80.165425
©2009 American Physical Society