Light intensity dependence of photocurrent gain in single-crystal diamond detectors

Meiyong Liao, Xi Wang, Tokuyuku Teraji, Satoshi Koizumi, and Yasuo Koide
Phys. Rev. B 81, 033304 – Published 13 January 2010

Abstract

The authors report on the photocurrent gain in a diamond photodetector that has two nonohmic contacts connected back-to-back. This photocurrent gain strongly depends on both the deep-ultraviolet (DUV) light intensity and the applied voltage. In addition, the gain is accompanied by a slow response. The gain is observed to originate from a metal/diamond interface trap center. Numerical analysis discloses that the photocurrent-voltage characteristics follow thermionic-field emission tunneling at low DUV light intensity and field-emission tunneling at high DUV light intensity. The deep traps are thought to produce a thin interface barrier layer at the metal/diamond interface under DUV illumination, which is responsible for the tunneling processes.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 4 August 2009

DOI:https://doi.org/10.1103/PhysRevB.81.033304

©2010 American Physical Society

Authors & Affiliations

Meiyong Liao*, Xi Wang, Tokuyuku Teraji, Satoshi Koizumi, and Yasuo Koide

  • Sensor Materials Center, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

  • *meiyong.liao@nims.go.jp
  • Present address: Department of Materials Science, Imperial College London, United Kingdom.

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 81, Iss. 3 — 15 January 2010

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×