Speckle correlation functions applied to surface plasmons

Frerik van Beijnum, Jeroen Sirre, Chris Rétif, and Martin P. van Exter
Phys. Rev. B 85, 035437 – Published 23 January 2012

Abstract

The optical intensity transmitted through a random pattern of subwavelength holes in a metal film exhibits a speckle pattern. We study the variation of this speckle pattern as a function of wavelength. We find that the resulting speckle correlation function (SCF) separates into a wavelength-dependent part and a wavelength-independent background. The wavelength dependence is caused by surface plasmons excited at one hole and coupled out at another hole, while the constant background originates from light transmitted directly through the holes. By analyzing the SCF for a set of samples of varying hole density, we find the propagation length of the surface plasmons and the scattering losses induced by the holes.

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  • Received 19 October 2011

DOI:https://doi.org/10.1103/PhysRevB.85.035437

©2012 American Physical Society

Authors & Affiliations

Frerik van Beijnum1, Jeroen Sirre1, Chris Rétif2, and Martin P. van Exter1

  • 1Huygens Laboratory, Leiden University, P.O. Box 9504, NL-2300 RA Leiden, The Netherlands
  • 2FOM Institute for Atomic and Molecular Physics, Science Park 104, NL-1098 XG Amsterdam, The Netherlands

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Issue

Vol. 85, Iss. 3 — 15 January 2012

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