Stability and electronic structures of native defects in single-layer MoS2

Ji-Young Noh, Hanchul Kim, and Yong-Sung Kim
Phys. Rev. B 89, 205417 – Published 19 May 2014

Abstract

The atomic and electronic structures and stability of native defects in a single-layer MoS2 are investigated, based on density-functional theory calculations. Native defects such as a S vacancy (VS), a S interstitial (Si), a Mo vacancy (VMo), and a Mo interstitial (Moi) are considered. The Si is found to have S-adatom configuration on top of a host S atom, and the Moi has Mo-Moi split interstitial configuration along the c direction. The formation energies of the native defects in neutral and charged states are calculated. For the charged states, the artificial electrostatic interactions between image charges in supercells are eliminated by a supercell size scaling scheme and a correction scheme that uses a Gaussian model charge. It is found that the VS has a low formation energy of 1.3–1.5 eV in the Mo-rich limit condition, and the Si has 1.0 eV in the S-rich limit condition. The VS is found to be a deep single acceptor with the (0/) transition level at 1.7 eV above the valence-band maximum (VBM). The Si is found to be an electrically neutral defect. The Mo-related native defects of VMo and Moi are found to be high in formation energy above 4 eV. The VMo is a deep single acceptor and the Moi is a deep single donor, of which the (0/) acceptor and (+/0) donor transition levels are found at 1.1 and 0.3 eV above the VBM, respectively.

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  • Received 15 July 2013
  • Revised 17 March 2014

DOI:https://doi.org/10.1103/PhysRevB.89.205417

©2014 American Physical Society

Authors & Affiliations

Ji-Young Noh1,2, Hanchul Kim2, and Yong-Sung Kim1,3,*

  • 1Korea Research Institute of Standards and Science, Yuseong, Daejeon 305-340, Korea
  • 2Department of Nano Physics, Sookmyung Women's University, Seoul 140-742, Korea
  • 3Department of Nano Science, Korea University of Science and Technology, Daejeon 305-350, Korea

  • *yongsung.kim@kriss.re.kr

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Vol. 89, Iss. 20 — 15 May 2014

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