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Two-dimensional superconductor-insulator quantum phase transitions in an electron-doped cuprate

S. W. Zeng, Z. Huang, W. M. Lv, N. N. Bao, K. Gopinadhan, L. K. Jian, T. S. Herng, Z. Q. Liu, Y. L. Zhao, C. J. Li, H. J. Harsan Ma, P. Yang, J. Ding, T. Venkatesan, and Ariando
Phys. Rev. B 92, 020503(R) – Published 6 July 2015
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Abstract

We use an ionic liquid-assisted electric-field effect to tune the carrier density in an electron-doped cuprate ultrathin film and cause a two-dimensional superconductor-insulator transition (SIT). The low upper critical field in this system allows us to perform magnetic-field (B)-induced SIT in the liquid-gated superconducting film. Finite-size scaling analysis indicates that SITs induced both by electric and by magnetic fields are quantum phase transitions and the transitions are governed by percolation effects—quantum mechanical in the former and classical in the latter cases. Compared to the hole-doped cuprates, the SITs in the electron-doped system occur at critical sheet resistances (Rc) much lower than the pair quantum resistance RQ=h/(2e)2=6.45kΩ, suggesting the possible existence of fermionic excitations at finite temperatures at the insulating phase near the SITs.

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  • Received 21 May 2014
  • Revised 3 June 2015

DOI:https://doi.org/10.1103/PhysRevB.92.020503

©2015 American Physical Society

Authors & Affiliations

S. W. Zeng1,2, Z. Huang1, W. M. Lv1, N. N. Bao1,3, K. Gopinadhan1, L. K. Jian1, T. S. Herng3, Z. Q. Liu4, Y. L. Zhao1, C. J. Li1, H. J. Harsan Ma1,2, P. Yang5, J. Ding1,3, T. Venkatesan1,2,6,*, and Ariando1,2,*

  • 1NUSNNI-NanoCore, National University of Singapore, Singapore 117411
  • 2Department of Physics, National University of Singapore, Singapore 117542
  • 3Department of Materials Science and Engineering, National University of Singapore, Singapore 117576
  • 4Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
  • 5Singapore Synchrotron Light Source (SSLS), National University of Singapore, 5 Research Link, Singapore 117603
  • 6Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576

  • *Author to whom correspondence should be addressed: venky@nus.edu.sg and ariando@nus.edu.sg

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Issue

Vol. 92, Iss. 2 — 1 July 2015

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