Abstract
We have grown nearly freestanding single-layer on graphitized -SiC(0001) by using molecular beam epitaxy (MBE), and characterized its electronic structure with scanning tunneling microscopy/spectroscopy (STM/STS). The existence of topological edge states at the periphery of single-layer islands was confirmed. Surprisingly, a bulk band gap at the Fermi level and insulating behaviors were also found in single-layer at low temperature, which are likely associated with an incommensurate charge order transition. The realization of two-dimensional topological insulators (2D TIs) in single-layer transition-metal dichalcogenide provides a promising platform for further exploration of the 2D TIs’ physics and related applications.
- Received 11 February 2017
- Revised 5 April 2017
DOI:https://doi.org/10.1103/PhysRevB.96.041108
©2017 American Physical Society