Sharp interface limits of phase-field models

K. R. Elder, Martin Grant, Nikolas Provatas, and J. M. Kosterlitz
Phys. Rev. E 64, 021604 – Published 19 July 2001
PDFExport Citation

Abstract

The use of continuum phase-field models to describe the motion of well-defined interfaces is discussed for a class of phenomena that includes order–disorder transitions, spinodal decomposition and Ostwald ripening, dendritic growth, and the solidification of eutectic alloys. The projection operator method is used to extract the “sharp-interface limit” from phase-field models which have interfaces that are diffuse on a length scale ξ. In particular, phase-field equations are mapped onto sharp-interface equations in the limits ξκ1 and ξv/D1, where κ and v are, respectively, the interface curvature and velocity and D is the diffusion constant in the bulk. The calculations provide one general set of sharp-interface equations that incorporate the Gibbs–Thomson condition, the Allen–Cahn equation, and the Kardar–Parisi–Zhang equation.

  • Received 25 October 2000

DOI:https://doi.org/10.1103/PhysRevE.64.021604

©2001 American Physical Society

Authors & Affiliations

K. R. Elder1,*, Martin Grant2, Nikolas Provatas2,3, and J. M. Kosterlitz4

  • 1Department of Physics, Oakland University, Rochester, Michigan 48309-4487
  • 2Physics Department, Rutherford Building, 3600 rue University, McGill University, Montréal, Québec, Canada H3A 2T8
  • 3Pulp and Paper Research Institute of Canada, 570 St. Jean Blvd, Montréal, Québec, Canada H9R-3J9
  • 4Department of Physics, Brown University, Providence, Rhode Island 02912

  • *Electronic address: elder@oakland.edu

References (Subscription Required)

Click to Expand
Issue

Vol. 64, Iss. 2 — August 2001

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review E

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×