Increased Phonon Scattering by Nanograins and Point Defects in Nanostructured Silicon with a Low Concentration of Germanium

G. H. Zhu, H. Lee, Y. C. Lan, X. W. Wang, G. Joshi, D. Z. Wang, J. Yang, D. Vashaee, H. Guilbert, A. Pillitteri, M. S. Dresselhaus, G. Chen, and Z. F. Ren
Phys. Rev. Lett. 102, 196803 – Published 14 May 2009

Abstract

The mechanism for phonon scattering by nanostructures and by point defects in nanostructured silicon (Si) and the silicon germanium (Ge) alloy and their thermoelectric properties are investigated. We found that the thermal conductivity is reduced by a factor of 10 in nanostructured Si in comparison with bulk crystalline Si. However, nanosize interfaces are not as effective as point defects in scattering phonons with wavelengths shorter than 1 nm. We further found that a 5at.% Ge replacing Si is very efficient in scattering phonons shorter than 1 nm, resulting in a further thermal conductivity reduction by a factor of 2, thereby leading to a thermoelectric figure of merit 0.95 for Si95Ge5, similar to that of large grained Si80Ge20 alloys.

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  • Received 26 November 2008

DOI:https://doi.org/10.1103/PhysRevLett.102.196803

©2009 American Physical Society

Authors & Affiliations

G. H. Zhu1, H. Lee2, Y. C. Lan1, X. W. Wang1, G. Joshi1, D. Z. Wang1, J. Yang1, D. Vashaee3, H. Guilbert1, A. Pillitteri1, M. S. Dresselhaus4, G. Chen2,*, and Z. F. Ren1,*

  • 1Department of Physics, Boston College, Chestnut Hill, Massachusetts 02467, USA
  • 2Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
  • 3Department of Electrical and Computer Engineering, Oklahoma State University, Tulsa, Oklahoma 74106, USA
  • 4Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

  • *To whom correspondence should be addressed. gchen2@mit.edu (G. C.); renzh@bc.edu (Z. F. R.)

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Vol. 102, Iss. 19 — 15 May 2009

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