Defect Scattering in Graphene

Jian-Hao Chen, W. G. Cullen, C. Jang, M. S. Fuhrer, and E. D. Williams
Phys. Rev. Lett. 102, 236805 – Published 12 June 2009
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Abstract

Irradiation of graphene on SiO2 by 500 eV Ne and He ions creates defects that cause intervalley scattering as is evident from a significant Raman D band intensity. The defect scattering gives a conductivity proportional to charge carrier density, with mobility decreasing as the inverse of the ion dose. The mobility decrease is 4 times larger than for a similar concentration of singly charged impurities. The minimum conductivity decreases proportional to the mobility to values lower than 4e2/πh, the minimum theoretical value for graphene free of intervalley scattering. Defected graphene shows a diverging resistivity at low temperature, indicating insulating behavior. The results are best explained by ion-induced formation of lattice defects that result in midgap states.

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  • Received 23 March 2009

DOI:https://doi.org/10.1103/PhysRevLett.102.236805

©2009 American Physical Society

Authors & Affiliations

Jian-Hao Chen1,2, W. G. Cullen2, C. Jang2, M. S. Fuhrer1,2, and E. D. Williams1,2

  • 1Materials Research Science and Engineering Center, Department of Physics, University of Maryland, College Park, Maryland 20742 USA
  • 2Center for Nanophysics and Advanced Materials, Department of Physics, University of Maryland, College Park, Maryland 20742 USA

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Issue

Vol. 102, Iss. 23 — 12 June 2009

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