Cloaked Near-Field Scanning Optical Microscope Tip for Noninvasive Near-Field Imaging

Andrea Alù and Nader Engheta
Phys. Rev. Lett. 105, 263906 – Published 29 December 2010
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Abstract

Near-field imaging is a well-established technique in biomedical measurements, since closer to the detail of interest it is possible to resolve subwavelength details otherwise unresolved by regular lenses. A near-field scanning optical microscope (NSOM) tip may indeed overcome the resolution limits of far-field optics, but its proximity inherently perturbs the measurement. Here, we apply the recent concept of a “cloaked sensor” to an NSOM device in collection mode, showing theoretically how a proper plasmonic cover applied to an NSOM tip may drastically improve its overall measurement capabilities.

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  • Received 28 July 2010

DOI:https://doi.org/10.1103/PhysRevLett.105.263906

© 2010 The American Physical Society

Authors & Affiliations

Andrea Alù1 and Nader Engheta2

  • 1Department of Electrical and Computer Engineering, The University of Texas at Austin, 1 University Station C0803, Austin, Texas 78712, USA
  • 2Department of Electrical and Systems Engineering, University of Pennsylvania, 200 South 33rd Street, ESE 203 Moore, Philadelphia, Pennsylvania 19104, USA

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Issue

Vol. 105, Iss. 26 — 31 December 2010

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