Layer-Resolved Study of Mg Atom Incorporation at the MgO/Ag(001) Buried Interface

T. Jaouen, S. Tricot, G. Delhaye, B. Lépine, D. Sébilleau, G. Jézéquel, and P. Schieffer
Phys. Rev. Lett. 111, 027601 – Published 11 July 2013

Abstract

By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL23L23 Auger transition in MgO ultrathin films (4–6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects both band-offset variations at the interface and band bending effects in the oxide film.

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  • Received 10 April 2013

DOI:https://doi.org/10.1103/PhysRevLett.111.027601

© 2013 American Physical Society

Authors & Affiliations

T. Jaouen1,2,*, S. Tricot2, G. Delhaye2, B. Lépine2, D. Sébilleau2, G. Jézéquel2, and P. Schieffer2,†

  • 1Département de Physique and Fribourg Center for Nanomaterials, Université de Fribourg, CH-1700 Fribourg, Switzerland
  • 2Département Matériaux Nanosciences, Institut de Physique de Rennes UMR UR1-CNRS 6251, Université de Rennes 1, F-35042 Rennes Cedex, France

  • *Corresponding author. thomas.jaouen@unifr.ch
  • Corresponding author. philippe.schieffer@univ-rennes1.fr

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Issue

Vol. 111, Iss. 2 — 12 July 2013

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