Temperature Dependence of the Static Dielectric Constant of a Symmetry-Induced Zero-Gap Semiconductor

J. G. Broerman
Phys. Rev. Lett. 25, 1658 – Published 14 December 1970
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Abstract

It is shown that the random-phase approximation static dielectric constant of a semiconductor with a Γ8 conduction—valence-band degeneracy is nondivergent at zero momentum transfer for any concentration of ionized impurities (including the intrinsic material) so long as T0. The temperature dependence of the dielectric constant is calculated. It is shown that in the nondegenerate limit the dependence of the interband polarization is pure T12. Illustrative calculations are presented for αSn.

  • Received 24 September 1970

DOI:https://doi.org/10.1103/PhysRevLett.25.1658

©1970 American Physical Society

Authors & Affiliations

J. G. Broerman

  • McDonnell Douglas Research Laboratories, McDonnell Douglas Corporation, St. Louis, Missouri 63166

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Issue

Vol. 25, Iss. 24 — 14 December 1970

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