Raman Spectra of Amorphous Si and Related Tetrahedrally Bonded Semiconductors

J. E. Smith, Jr., M. H. Brodsky, B. L. Crowder, M. I. Nathan, and A. Pinczuk
Phys. Rev. Lett. 26, 642 – Published 15 March 1971
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Abstract

Raman scattering has been studied in the amorphous form of Si and several related, tetrahedrally bonded semiconductors (Ge, GaAs, GaP, InSb). All vibrational modes of the material can take part in the scattering process, and the Raman spectrum is a measure of the density of vibrational states. The amorphous phases are found to have vibrational spectra very similar to the corresponding crystals, reflecting the similarity in short-range order of the two phases.

  • Received 12 February 1971

DOI:https://doi.org/10.1103/PhysRevLett.26.642

©1971 American Physical Society

Authors & Affiliations

J. E. Smith, Jr., M. H. Brodsky, B. L. Crowder, and M. I. Nathan

  • IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598

A. Pinczuk*

  • University of Pennsylvania, Philadelphia, Pennsylvania 19104

  • *Present address: Comisión Nacional de Energía Atómica, Avenida Libertador 8250, Buenos Aires, Argentina.

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Issue

Vol. 26, Iss. 11 — 15 March 1971

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