Dependence of X-Ray Yields in Argon, Krypton, and Xenon upon the Charge State of Fluorine Ions at 35.7 MeV

James R. Macdonald; Loren Winters; Matt D. Brown; Tang Chiao; Louis D. Ellsworth

doi:10.1103/PhysRevLett.29.1291

Dependence of X-Ray Yields in Argon, Krypton, and Xenon upon the Charge State of Fluorine Ions at 35.7 MeV

James R. Macdonald, Loren Winters, Matt D. Brown, Tang Chiao, and Louis D. Ellsworth

Phys. Rev. Lett. 29, 1291 – Published 6 November 1972

Abstract

In high-velocity ion-atom single collisions, a strong dependence of target x-ray production cross sections upon the ionic charge state has been observed. Experiments were performed in thin gas targets of argon, krypton, and xenon with 35.7-MeV fluorine ions incident in charge states +5 to +9. Production cross sections for Ar $K$ , Kr $L$ , and Xe $L$ characteristic lines increase by as much as a factor of 5 with increasing incident charge state but cannot be fitted by a $q^{2}$ dependence.