Note on the Anisotropy of the Conductivity in Thin Amorphous Films

M. Pollak and J. J. Hauser
Phys. Rev. Lett. 31, 1304 – Published 19 November 1973
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Abstract

We present a new interpretation of the anisotropy of the conductivity in thin films of amorphous Ge and Si. The interpretation is based on a transition from percolation conduction to Miller and Abrahams's conduction at small film thickness. A simple theory, together with experimental data, is presented. The comparison between them is found to be good.

  • Received 16 August 1973

DOI:https://doi.org/10.1103/PhysRevLett.31.1304

©1973 American Physical Society

Authors & Affiliations

M. Pollak

  • Department of Physics, University of California, Riverside, California 92505

J. J. Hauser

  • Bell Telephone Laboratories, Murray Hill, New Jersey 07974

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Issue

Vol. 31, Iss. 21 — 19 November 1973

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