Surface-Electromagnetic-Wave-Enhanced Raman Scattering by Overlayers on Metals

Y. J. Chen, W. P. Chen, and E. Burstein
Phys. Rev. Lett. 36, 1207 – Published 17 May 1976
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Abstract

Using a general formulation we show that by using surface electromagnetic waves in an attenuated-total-reflection prism configuration it should be possible to enhance the intensity of Raman scattering by a thin overlayer on a Ag surface by two orders of magnitude and that the use of surface electromagnetic waves may in fact make it possible to observe coherent anti-Stokes Raman scattering by the overlayer.

  • Received 18 March 1976

DOI:https://doi.org/10.1103/PhysRevLett.36.1207

©1976 American Physical Society

Authors & Affiliations

Y. J. Chen*, W. P. Chen, and E. Burstein

  • Department of Physics and the Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, Pennsylvania 19174

  • *IBM Fellow (1975-1976).
  • Work supported in part by the U. S. Army Research Offic, Durham, under Contract No. DAHC/0181 and by the Advanced Research Projects Agency under Contract No. CNF-44620-75-C-0069 (monitored by the U. S. Air Force Office of Scientific Research).

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Issue

Vol. 36, Iss. 20 — 17 May 1976

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