Negative-U States in the Gap in Hydrogenated Amorphous Silicon

R. Fisch and D. C. Licciardello
Phys. Rev. Lett. 41, 889 – Published 25 September 1978
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Abstract

We propose that Si-H-Si three-center bonds exist in hydrogenated amorphous silicon. These centers give rise to states in the energy gap which have a negative effective electronic correlation energy, U. Our model can explain many of the known properties of this material. We make suggestions about how to obtain materials which may prove useful in electronic device applications.

  • Received 18 May 1978

DOI:https://doi.org/10.1103/PhysRevLett.41.889

©1978 American Physical Society

Authors & Affiliations

R. Fisch and D. C. Licciardello

  • Department of Physics, Princeton University, Princeton, New Jersey 08540

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Issue

Vol. 41, Iss. 13 — 25 September 1978

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