Half-Life of Si32 from Tandem-Accelerator Mass Spectrometry

D. Elmore, N. Anantaraman, H. W. Fulbright, H. E. Gove, H. S. Hans, K. Nishiizumi, M. T. Murrell, and M. Honda
Phys. Rev. Lett. 45, 589 – Published 25 August 1980
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Abstract

In one of the first applications of the new accelerator mass-spectrometry technique to nuclear physics problems, the half-life of Si32 has been determined to be 108±18 yr. This result, which disagrees with the accepted value of 330±40 yr, has special significance because of the use of Si32 for dating studies.

  • Received 12 May 1980

DOI:https://doi.org/10.1103/PhysRevLett.45.589

©1980 American Physical Society

Authors & Affiliations

D. Elmore, N. Anantaraman*, H. W. Fulbright, H. E. Gove, and H. S. Hans

  • Nuclear Structure Research Laboratory, University of Rochester, Rochester, New York 14627

K. Nishiizumi and M. T. Murrell

  • Department of Chemistry, University of California at San Diego, La Jolla, California 92093

M. Honda

  • Institute for Solid State Physics, University of Tokyo, Tokyo 106, Japan

  • *Present address: Cyclotron Laboratory, Michigan State University, East Lansing, Michigan 48824.
  • On leave from Panjab University, Chandigarh, India.

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Vol. 45, Iss. 8 — 25 August 1980

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