Measurement of the <span class="aps-inline-formula"><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><mrow><mmultiscripts><mrow><mi mathvariant="normal">Si</mi></mrow><mprescripts></mprescripts><mrow></mrow><mrow><mn>32</mn></mrow><mrow></mrow><mrow></mrow></mmultiscripts></mrow></math></span> Half-Life via Accelerator Mass Spectrometry

W. Kutschera; W. Henning; M. Paul; R. K. Smither; E. J. Stephenson; J. L. Yntema; D. E. Alburger; J. B. Cumming; G. Harbottle

doi:10.1103/PhysRevLett.45.592

Measurement of the ${}^{32}{Si}$ Half-Life via Accelerator Mass Spectrometry

W. Kutschera, W. Henning, M. Paul, R. K. Smither, E. J. Stephenson, J. L. Yntema, D. E. Alburger, J. B. Cumming, and G. Harbottle

Phys. Rev. Lett. 45, 592 – Published 25 August 1980

Abstract

The half-life of ${}^{32}{Si}$ has been measured to be $T_{\frac{1}{2}} = 101 \pm 18$ yr, considerably shorter than the previously accepted value of ≈ 300 yr. The new value was obtained by measuring the specific $β$ activity with a liquid-scintillation-counter technique and the ${}^{32}{Si}$ concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic ${}^{32}{Si}$ .

Received 19 May 1980

DOI:https://doi.org/10.1103/PhysRevLett.45.592

Authors & Affiliations

W. Kutschera, W. Henning, M. Paul^*, R. K. Smither, E. J. Stephenson^†, and J. L. Yntema

Argonne National Laboratory, Argonne, Illinois 60439

D. E. Alburger, J. B. Cumming, and G. Harbottle

Brookhaven National Laboratory, Upton, New York 11973

^*Present address: Racah Institute of Physics, Hebrew University of Jerusalem, Jerusalem, Israel.
^†Present address: Indiana University Cyclotron Facility, Bloomington, Indiana 47405.