Effect of Cluster Surface Energies on Secondary-Ion-Intensity Distributions from Ionic Crystals

J. E. Campana, T. M. Barlak, R. J. Colton, J. J. DeCorpo, J. R. Wyatt, and B. I. Dunlap
Phys. Rev. Lett. 47, 1046 – Published 12 October 1981
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Abstract

Ultrahigh-mass cluster ions (mz>18000) of the type [M(MX)n]+ have been produced by xenon-ion bombardment of CsI and detected by a high-performance secondary-ion mass spectrometer. The mass spectra (ion intensity versus n) show anomalous behavior which is correlated with hypothesized dominance of cubiclike clusters having low surface energies.

  • Received 22 June 1981

DOI:https://doi.org/10.1103/PhysRevLett.47.1046

©1981 American Physical Society

Authors & Affiliations

J. E. Campana, T. M. Barlak, R. J. Colton, J. J. DeCorpo, J. R. Wyatt, and B. I. Dunlap

  • Chemistry Division, Naval Research Laboratory, Washington, D. C. 20375

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Vol. 47, Iss. 15 — 12 October 1981

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