Surface Phonon Dispersion of Ni(100) Measured by Inelastic Electron Scattering

S. Lehwald, J. M. Szeftel, H. Ibach, T. S. Rahman, and D. L. Mills
Phys. Rev. Lett. 50, 518 – Published 14 February 1983
PDFExport Citation

Abstract

The thermal diffuse background between diffracted electron beams has been analyzed with high-energy resolution. The main contribution arises from a surface phonon single-scattering event. The surface phonon dispersion is measured along the Γ¯X¯ direction, and compared with theoretical models.

  • Received 29 November 1982

DOI:https://doi.org/10.1103/PhysRevLett.50.518

©1983 American Physical Society

Authors & Affiliations

S. Lehwald, J. M. Szeftel*, and H. Ibach

  • Institut für Grenzflachenforschung und Vakuumphysik, Kernforschungsanlage Julich, D-5170 Julich, West Germany

T. S. Rahman and D. L. Mills

  • Department of Physics, University of California, Irvine, California 92717

  • *Permanent address: S. P. A. S., Centre d'Etudes Nucléaires de Saclay, F-91191 Gif-sur-Yvette Cédex, France.

References (Subscription Required)

Click to Expand
Issue

Vol. 50, Iss. 7 — 14 February 1983

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×