Creation of Quasistable Lattice Defects by Electronic Excitation in SiO2

Katsumi Tanimura, Takeshi Tanaka, and Noriaki Itoh
Phys. Rev. Lett. 51, 423 – Published 1 August 1983
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Abstract

The transient volume change of α-quartz and fused silica induced by irradiation with an electron pulse has been measured above 80 K. It is shown that transient changes of volume and optical absorption due to the E1 centers (oxygen vacancies) decay in parallel and that the volume change per E1 center is of the order of a unit molecular volume. The results show unambiguously that recombination-induced defect formation occurs in SiO2 but the defects created are not stable even at low temperatures.

  • Received 18 April 1983

DOI:https://doi.org/10.1103/PhysRevLett.51.423

©1983 American Physical Society

Authors & Affiliations

Katsumi Tanimura, Takeshi Tanaka, and Noriaki Itoh

  • Department of Crystalline Materials Science, Faculty of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464, Japan

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Issue

Vol. 51, Iss. 5 — 1 August 1983

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