Amorphous-to-Quasicrystalline Transformation in the Solid State

D. A. Lilienfeld; M. Nastasi; H. H. Johnson; D. G. Ast; J. W. Mayer

doi:10.1103/PhysRevLett.55.1587

Amorphous-to-Quasicrystalline Transformation in the Solid State

D. A. Lilienfeld, M. Nastasi, H. H. Johnson, D. G. Ast, and J. W. Mayer

Phys. Rev. Lett. 55, 1587 – Published 7 October 1985

Abstract

${Al}_{84}$ ${Mn}_{16}$ multilayer films have been amorphized by room-temperature ion-beam irradiation. The amorphous phase was transformed into the quasicrystalline state through two routes: thermal and ion-beam-assisted thermal. The intensity of the quasicrystalline electron diffraction increases continuously with annealing between 270 and 350 °C. Ion irradiation of the amorphous phase produces a more complete set of icosahedral diffraction lines than thermal annealing.