Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K

W. F. Egelhoff, Jr. and I. Jacob
Phys. Rev. Lett. 62, 921 – Published 20 February 1989; Erratum Phys. Rev. Lett. 62, 1577 (1989)
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Abstract

Strong intensity oscillations have been found in RHEED during epitaxial growth at 77 K. This temperature is too low for thermally activated diffusion and establishes that the deposited atom uses its latent heat of condensation to skip across the surface, preferentially coming to rest at growing island edges, to achieve quasi—layer-by-layer growth. This growth mechanism implies that RHEED oscillations should be observable at 0 K. The data also provide insight into the basic principles governing RHEED oscillations.

  • Received 16 September 1988

DOI:https://doi.org/10.1103/PhysRevLett.62.921

©1989 American Physical Society

Erratum

Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K

W. F. Egelhoff, Jr. and I. Jacob
Phys. Rev. Lett. 62, 1577 (1989)

Authors & Affiliations

W. F. Egelhoff, Jr. and I. Jacob*

  • Surface Science Division, National Bureau of Standards, Gaithersburg, Maryland 20899

  • *On leave from Department of Nuclear Engineering, Ben-Gurion University, Beer-Sheva, Israel.

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Vol. 62, Iss. 8 — 20 February 1989

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