Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy

Oleg Kolosov, Alexei Gruverman, Jun Hatano, Koichiro Takahashi, and Hiroshi Tokumoto
Phys. Rev. Lett. 74, 4309 – Published 22 May 1995
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Abstract

The nanoscale visualization and control of domain structure with atomic force microscopy (AFM) in the ferroelectric crystal guanidinium aluminum sulfate hexahydrate is reported. The origin of the domain contrast in the topographic of AFM images is explained by the piezoelectric deformation of the crystal surface in the internal electric field. The domain structure was modified by applying a voltage to the conductive AFM tip. The dynamics of domain growth has been directly observed for the first time with a resolution of 10 nm.

  • Received 17 March 1994

DOI:https://doi.org/10.1103/PhysRevLett.74.4309

©1995 American Physical Society

Authors & Affiliations

Oleg Kolosov, Alexei Gruverman, Jun Hatano, Koichiro Takahashi, and Hiroshi Tokumoto

  • Joint Research Center for Atom Technology, Angstrom Technology Partnership and National Institute for Advanced Interdisciplinary Research, 1-1-2, Higashi, Tsukuba, Ibaraki 305, Japan
  • Mechanical Engineering Laboratory, Namiki 1-2, Tsukuba, Ibaraki 305, Japan
  • National Institute for Research in Inorganic Materials, 1-1 Namiki, Tsukuba, Ibaraki 305, Japan
  • Department of Materials Science and Technology, Science University of Tokyo, Noda, Chiba 278, Japan

Comments & Replies

Kolosov Replies:

Oleg Kolosov
Phys. Rev. Lett. 76, 4292 (1996)

Comment on “Nanoscale Visualization and Control of Ferroelectric Domains by Atomic Force Microscopy”

R. Lüthi and E. Meyer
Phys. Rev. Lett. 76, 4291 (1996)

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Vol. 74, Iss. 21 — 22 May 1995

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