Superhard and Elastic Carbon Nitride Thin Films Having Fullerenelike Microstructure

H. Sjöström, S. Stafström, M. Boman, and J.-E. Sundgren
Phys. Rev. Lett. 75, 1336 – Published 14 August 1995; Erratum Phys. Rev. Lett. 76, 2205 (1996)
PDFExport Citation

Abstract

CNx films were found to have a distorted graphitelike microstructure consisting of buckled and curved basal planes using high-resolution electron microscopy. Nanoindentation showed an elastic recovery of 85%, and a hardness of 60 GPa. Based on detailed quantum chemical calculations and photoelectron spectroscopy, the observed structure is proposed to consist of a network of buckled sp2-hybridized CNx planes, cross-linked by sp3-hybridized bonds. The buckling is shown to be due to the incorporation of pentagons in the basal planes, giving rise to a fullerenelike microstructure.

  • Received 2 May 1995

DOI:https://doi.org/10.1103/PhysRevLett.75.1336

©1995 American Physical Society

Erratum

Superhard and Elastic Carbon Nitride Thin Films Having Fullerenelike Microstructure

H. Sjöström, S. Stafström, M. Boman, and J. -E. Sundgren
Phys. Rev. Lett. 76, 2205 (1996)

Authors & Affiliations

H. Sjöström, S. Stafström, M. Boman, and J.-E. Sundgren

  • Department of Physics, Linköping University, S-581 83 Linköping, Sweden

References (Subscription Required)

Click to Expand
Issue

Vol. 75, Iss. 7 — 14 August 1995

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×