Backbond Oxidation of the Si(001) Surface: Narrow Channel of Barrierless Oxidation

Koichi Kato, Tsuyoshi Uda, and Kiyoyuki Terakura
Phys. Rev. Lett. 80, 2000 – Published 2 March 1998
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Abstract

Oxidation of the Si(001) surface was studied by the first principles calculation technique with spin-polarized gradient approximation. We have clarified the apparent barrierless reaction mechanism of the backbond oxidation of the surface Si by incoming O2 molecules. An O2 molecule does not attack directly the backbond but the oxidation occurs via metastable chemisorption states on the Si surface. We have also found that the triplet-to-singlet spin conversion is crucial in explaining the incident energy dependence of the sticking probability of O2 molecules.

  • Received 23 June 1997

DOI:https://doi.org/10.1103/PhysRevLett.80.2000

©1998 American Physical Society

Authors & Affiliations

Koichi Kato and Tsuyoshi Uda

  • Joint Research Center for Atom Technology, Angstrom Technology Partnership, 1-1-4 Higashi, Tsukuba, Ibaraki 305, Japan

Kiyoyuki Terakura

  • Joint Research Center for Atom Technology, National Institute for Advanced Interdisciplinary Research, 1-1-4 Higashi, Tsukuba, Ibaraki 305, Japan

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Issue

Vol. 80, Iss. 9 — 2 March 1998

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