We use the x-ray extended-range technique (XERT) [C. T. Chantler et al., Phys. Rev. A 64, 062506 (2001)] to measure the mass attenuation coefficients of tin in the x-ray energy range of $29–60\mathrm{keV}$ to $0.04–3\%$ accuracy, and typically in the range $0.1–0.2\%$. Measurements made over an extended range of the measurement parameter space are critically examined to identify, quantify, and correct a number of potential experimental systematic errors. These results represent the most extensive experimental data set for tin and include absolute mass attenuation coefficients in the regions of x-ray absorption fine structure, extended x-ray absorption fine structure, and x-ray absorption near-edge structure. The imaginary component of the atomic form factor $f_2$ is derived from the photoelectric absorption after subtracting calculated Rayleigh and Compton scattering cross sections from the total attenuation. Comparison of the result with tabulations of calculated photoelectric absorption coefficients indicates that differences of $1–2\%$ persist between calculated and observed values.

• Received 11 September 2006

DOI:https://doi.org/10.1103/PhysRevA.75.032702