Measurement and Simulation of Mechanical and Optical Properties of Sputtered Amorphous SiC Coatings

G. Favaro, M. Bazzan, A. Amato, F. Arciprete, E. Cesarini, A.J. Corso, F. De Matteis, T.H. Dao, M. Granata, C. Honrado-Benítez, N. Gutiérrez-Luna, J.I. Larruquert, G. Lorenzin, D. Lumaca, G. Maggioni, M. Magnozzi, M.G. Pelizzo, E. Placidi, P. Prosposito, and F. Puosi
Phys. Rev. Applied 18, 044030 – Published 12 October 2022

Abstract

In this work we report on the extensive characterization of amorphous silicon carbide (a-SiC) coatings prepared by physical deposition methods. Our investigation is performed within the perspective application of a-SiC as an optical material for high-precision optical experiments and, in particular, in gravitational wave interferometry. We compare the results obtained with two different sputtering systems [a standard radio frequency (rf) magnetron sputtering and an ion-beam sputtering] to grasp the impact of two different setups on the repeatability of the results. After a thorough characterization of structural, morphological, and compositional characteristics of the prepared samples, we focus on a detailed study of the optical and mechanical losses in those materials. Mechanical losses are further investigated from a microscopic point of view by comparing our experimental results with molecular dynamic simulations of the amorphous SiC structure: first we define a protocol to generate a numerical model of the amorphous film, capturing the main features of the real system; then we simulate its dynamical behavior upon deformation in order to obtain its mechanical response.

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  • Received 1 April 2022
  • Revised 30 July 2022
  • Accepted 11 August 2022

DOI:https://doi.org/10.1103/PhysRevApplied.18.044030

© 2022 American Physical Society

Physics Subject Headings (PhySH)

Gravitation, Cosmology & AstrophysicsCondensed Matter, Materials & Applied PhysicsAtomic, Molecular & Optical

Authors & Affiliations

G. Favaro1, M. Bazzan1,*, A. Amato2, F. Arciprete3,4, E. Cesarini4, A.J. Corso5, F. De Matteis3,4, T.H. Dao3,4, M. Granata6, C. Honrado-Benítez7, N. Gutiérrez-Luna7, J.I. Larruquert7, G. Lorenzin1, D. Lumaca3,4, G. Maggioni1, M. Magnozzi8, M.G. Pelizzo1, E. Placidi9, P. Prosposito3,4, and F. Puosi10

  • 1Università di Padova, Padova I-35131, Italy
  • 2Université de Lyon, Université Claude Bernard Lyon 1, CNRS, Institut Lumière Matière, Villeurbanne F-69622, France
  • 3Università di Roma Tor Vergata, Roma I-00133, Italy
  • 4INFN, Sezione di Roma Tor Vergata, Roma I-00133, Italy
  • 5CNR, Istituto di Fotonica e Nanotecnologie, Padova I-35131, Italy
  • 6Laboratoire des Matériaux Avancés - IP2I, CNRS, Université de Lyon, Université Claude Bernard Lyon 1, Villeurbanne F-69622, France
  • 7GOLD-IO-CSIC, Serrano 144, Madrid S-28006, Spain
  • 8Università di Genova, Genova I-16146, Italy
  • 9Università di Roma “La Sapienza”, Roma I-00185, Italy
  • 10INFN, Sezione di Pisa, Pisa I-56127, Italy

  • *Author to whom correspondence should be addressed. marco.bazzan@unipd.it

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Vol. 18, Iss. 4 — October 2022

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