Bulk boundary conditions for injection and extraction in trap-free lifetime and relaxation semiconductors

T. Stoica and C. Popescu
Phys. Rev. B 17, 3972 – Published 15 May 1978
PDFExport Citation

Abstract

Small-carrier perturbations close to the unperturbed bulk are analyzed which represent boundary conditions for the perturbations produced by injection and extraction in thick enough semiconductor samples. On this basis concentration contours for the strong-perturbation range can be qualitatively drawn and even numerically evaluated. The results allow for a clear distinction to be made between lifetime and relaxation behavior. There is also an intermediary regime between these, and within it a new kind of steady state with oscillations in space is proved to be possible for appropriately chosen currents. Two new conditions have also been evidenced for the high current conduction in the asymptotic range: "equality recombination" in the deep-lifetime case, and "unperturbed conductivity" in the deep-relaxation case. Necessary conditions for obtaining an increase in resistance through injection have also been outlined.

  • Received 25 May 1977

DOI:https://doi.org/10.1103/PhysRevB.17.3972

©1978 American Physical Society

Authors & Affiliations

T. Stoica and C. Popescu

  • Institute for Physics and Technology of Materials, Bucharest, Romania

References (Subscription Required)

Click to Expand
Issue

Vol. 17, Iss. 10 — 15 May 1978

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×